JEOL - JSM-5600 Scanning Electron Microscope (SEM) - 1998

Scanning Electron Microscope (SEM) JEOL JSM-5600 made in Japan. Laboratory equipment for surface analysis and material characterization. Equipped with Oxford Instruments EDS detector model 6587 (ATW2), declared resolution of 138 eV at 5.9 keV, elemental X-ray analysis system, tilting sample chamber and vacuum system. It includes an electronic column, anti-vibration table, EDS Oxford Instruments detector and components visible in the photographs. Visually complete condition. It is advisable to verify the operation of the vacuum system, electronic cannon, control electronics and software before marketing.