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Failure Analysys Equipment THERMOFISHER OptiFIB Taipan G2+ DualBeam FIB-SEM System
electrical parts / electrical parts
Manufacturer: THERMOFISHER
Model:OptiFIB Taipan G2+ DualBeam FIB-SEM System
Type of machine: Failure Analysys Equipment
item-No.: 168524966
Quantity: 1
Date: 26.02.2026
Year of manufacture: 2019
Location: Portland, OR
Price:
Seller-item-No.:8343257
Manufacturer: ThermoFisher
Model: OptiFIB Taipan G2+
Year of Manufacture: 2019
Type of Machine : DualBeam Focused Ion Beam – Scanning Electron Microscope (FIB-SEM)
Condition: Used . Excellent working and physical condition, professionally inspected
Included Items:
1. Main DualBeam FIB-SEM column and stage
2. Control console and computer with new SSD installed, fully processed and ready for operation
3. De Chemistry and DX Chemistry units as pictured
4. Complete set of basic technical documentation
Advantages of This Unit:
Premium Source – Originates from Intel fabrication environment
Modern Platform – G2+ generation offers enhanced U6358834 resolution and stability for advanced nanofabrication and 3D analysis
Plug-and-Play Ready – Serviced and fitted with critical new components
Ideal For: Semiconductor failure analysis, materials science research, nano-prototyping, life sciences
Find more here - /
Contact us at -
Model: OptiFIB Taipan G2+
Year of Manufacture: 2019
Type of Machine : DualBeam Focused Ion Beam – Scanning Electron Microscope (FIB-SEM)
Condition: Used . Excellent working and physical condition, professionally inspected
Included Items:
1. Main DualBeam FIB-SEM column and stage
2. Control console and computer with new SSD installed, fully processed and ready for operation
3. De Chemistry and DX Chemistry units as pictured
4. Complete set of basic technical documentation
Advantages of This Unit:
Premium Source – Originates from Intel fabrication environment
Modern Platform – G2+ generation offers enhanced U6358834 resolution and stability for advanced nanofabrication and 3D analysis
Plug-and-Play Ready – Serviced and fitted with critical new components
Ideal For: Semiconductor failure analysis, materials science research, nano-prototyping, life sciences
Find more here - /
Contact us at -
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